Abstract
Electronic transport and magnetic properties of Ti x Cr1−x O2 epitaxial films with low Ti concentrations have been studied. Compared with pure CrO2 film, Ti-doped films exhibit a significant increase of resistivity and the magnetoresistance at low temperature is more difficult to saturate even under an external field of 5 Tesla. The DC magnetization and AC susceptibility measurements suggest that a cluster glass freezing behavior occurs at low temperature in Ti-doped films. After analyzing the AC susceptibility using dynamic scaling theory, we have obtained the cluster-glass transition temperature T G = 97.8 K, the dynamic exponent zv = 12.37, and the characteristic timescale τ 0 = 10−16, which lies in the range of conventional cluster glass systems.
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