Abstract
Here we report on the first results of PbTe epitaxial films with high Bi content above doping concentrations grown on BaF 2 in order to obtain nanoscale precipitates. The crystal structure is investigated by x-ray diffraction (XRD) measurements and no other phases than well-oriented PbTe could be found. These layers have been investigated by Hall-effect and Seebeck-effect measurements. The dependence of the Seebeck coefficient on the carrier concentration cannot be explained by simple Boltzmann statistics. Fourier-transform infrared (FTIR) transmission spectra also show some irregularities. These phenomena are interpreted as hints to nanoscale inclusions. The thermal conductivity is measured with the time-domain thermal reflectance method, developed by D. Cahill, to complete the thermoelectric characterizations.
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