Transport Properties for YBCO Films Prepared by In-field CVD Process

Abstract

We measured the high field transport properties as functions of temperature, magnetic field and field angles for the YBCO films deposited in the 0 T and the 8 T by the in‐field CVD process. The FWHM values in φ−scan of 103 reflection are about 3.6 ° for 0T sample and 2.8 ° for 8T sample. Both films show the dip structure at B//c in the angular dependence of resistivity in a magnetic field. This means that the c‐axis correlated disorder works effectively in these samples. The dip in the angular dependence of resistivity appears below a certain temperature, which depends on the magnetic field. With decreasing temperature, it disappears once and then appears again for the 0T sample. However, this reentrant behavior is not observed in the 8T sample. Therefore we found that the possibility of two separated regions of the pinned vortex liquid phase and those may be related with the in‐plane texture through the grain boundary pinning.