Abstract
The I-V characteristics for atomic junction between two superconductors exhibit steps at voltages 2$\mathrm{\ensuremath{\Delta}}/n$ (with n=1, 2, 3, \dots{}) associated with multiple Andreev reflections (MAR). These features have been used in the past to determine the fundamental transport characteristics of atomic junctions. In this work, the authors present a development of the MAR technique by utilizing a superconducting Nb STM tip as one of the leads to study the transport properties of C${}_{60}$ fullerene molecule. By analyzing the tunneling spectra and high-resolution molecular imaging, they were able to determine the number of conduction channels for C${}_{6}0$ as well as the origin and the dependence of the transmission coefficients on the contact geometry.
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