Abstract
High T c ramp-type Josephson junctions have been successfully fabricated using a continually graded barrier Y 1− x Pr x Ba 2Cu 3O y . In these junctions the Josephson coupling occurs at the naturally formed S/N (superconducting/normal) interfaces within the Y 1− x Pr x Ba 2Cu 3O y layer. Such a barrier can lead to a highly transparent S/N boundary hence to greatly enhance the performance of junction. In contrast to most high- T c junctions, the properties of our junctions would be dominated by the barrier material rather than the boundary as such a boundary is absent in the weak link region. A unique feature of this novel barrier structure is that the effective thickness of the barrier can be varied even after fabrication, depending on the measuring temperature and the Pr-concentration gradient. It could make the transport process and the Josephson coupling differ from that of the conventional junctions. The temperature dependences of the barrier thickness and Josephson properties were investigated and compared with those of junctions with a conventional single barrier. Low values of proximity effect parameters found in our junctions show an advantage of this barrier structure.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
