Abstract
Doping limits, band gaps, work functions and energy band alignments of undoped and donor-doped transparent conducting oxides Zn₀, In₂O₃, and SnO₂ as accessed by X-ray and ultraviolet photoelectron spectroscopy (XPS/UPS) are summarized and compared. The presented collection provides an extensive data set of technologically relevant electronic properties of photovoltaic transparent electrode materials and illustrates how these relate to the underlying defect chemistry, the dependence of surface dipoles on crystallographic orientation and/or surface termination, and Fermi level pinning.
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