Abstract
Structural changes caused by electron-radiation damage during transmission-electron-microscopic observation were studied with low electron-beam-current-density of 1.8×10 −2 -5.0×10 −1 A/m 2 on specimens utilizing a microchannel plate for single crystals of polyvinylidene fluoride (PVDF), polyethylene (PE) and polyethylene oxide (PEO) as well as thin films of PVDF and vinylidene fluoride/trifluoroethylene (VDF/TrFe) copolymer developed on water surface from the solutions. Disappearance time of the crystalline diffraction pattern depended on the total electron dose at constant accelerating voltage and temperature. More pattern in the darkfield image was found more sensitive to the radiation damage than the diffraction pattern, which was related to the g-factor in the Hosemann's paracrystalline theory. Temperature effect was prominent in the case of PEO with a melting point lower than the other polymers. The total electron dose required to make the crystal amorphous increased almost linearly with accelerating voltage in all polymers examined. A microchannel plate was revealed to be useful through this study as an observation tool under the low electron-current condition
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