Abstract
As for the transmission muon microscopes（TμM）which are being developed at J-PARC, their principle, purpose, design and applications are reported. The TμM is an analog of a transmission electron microscope（TEM）, it employes muon beams generated by an accelerator, instead of the electron beams on TEM. The excellent material penetrating ability of accelerated muon beams allowed it to observe quite thick objects in high-resolutions. In particular, the TμM visualizes electromagnetic field distribution inside the thick bulk samples by using the Lorentz methods and the phase-contrast method. The TμM will be applied to a wide range of fields, not only academia but also industry.
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