Abstract
In a conventional TLP system, the pulse disturbance is applied to the DUT via the transmission line, whose characteristic impedance is <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$50\ \Omega$</tex> . However, the DUT for the evaluation, such as an ESD protection device, may be affected by the transmission line's characteristic impedance. This paper adds an impedance matching circuit to the conventional <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$50\ \Omega$</tex> TLP system, making it possible to adjust the circuit to an arbitrary value of the transmission line's characteristic impedance. By using the developed system, the I-V characteristics of an ESD protection device are evaluated when the characteristic impedance is <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$20\ \Omega,\ 50\ \Omega$</tex> , and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$150\ \Omega$</tex> . As a result, it was found that the negative resistance characteristics after the breakdown voltage change depending on the transmission line's characteristic impedance.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.