Abstract
In a conventional TLP system, the pulse disturbance is applied to the DUT via the transmission line, whose characteristic impedance is <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$50\ \Omega$</tex> . However, the DUT for the evaluation, such as an ESD protection device, may be affected by the transmission line's characteristic impedance. This paper adds an impedance matching circuit to the conventional <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$50\ \Omega$</tex> TLP system, making it possible to adjust the circuit to an arbitrary value of the transmission line's characteristic impedance. By using the developed system, the I-V characteristics of an ESD protection device are evaluated when the characteristic impedance is <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$20\ \Omega,\ 50\ \Omega$</tex> , and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$150\ \Omega$</tex> . As a result, it was found that the negative resistance characteristics after the breakdown voltage change depending on the transmission line's characteristic impedance.
Published Version
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