Abstract
The microstructure of Co-Cr thin films for perpendicular magnetic recording has been examined by transmission electron microscopy in both conventional (bright field/dark field and selected area diffraction) and convergent beam electron diffraction modes. Results of as-deposited samples indicate that the films consist of well-oriented c axis structures. A range of microstructures (columnar morphology, transition layers, twins, etc.) have been observed. These and other results will be presented.
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