Abstract
A thin-film sample of Al–Pd–Mn ternary alloy has been produced by a vacuum deposition technique using dual evaporation sources, followed by thermal annealing. The microstructure of the film has been examined by transmission electron microscopy (TEM) and by atomic force microscopy (AFM). The TEM observations reveal that the film has a granular texture of highly ordered icosahedral phase islands embedded in the matrix consisting mainly of multiple-twinned crystals exhibiting a pseudo-tenfold symmetry. It is shown by AFM that the icosahedral islands form protuberant structures with the average height of approximately 50 nm.
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