Abstract
In this paper, a semi-analytical technique to derive scattering coefficients of a three-dimensional multi-layered wall with doubly periodic interfaces is presented. First, the proposed method uses the periodicity of interfaces in the surface integral equation formulation to confine the integration interval to just one period. It also simplifies the formulation by using the extended boundary condition method (EBCM) and the spectral formulation of the background Green’s function. Then, each of the scattering coefficient matrices of interfaces and layers is treated as two-port networks, and the scattering matrix of the whole structure is derived using the scattering transfer matrix method. In a limiting case, the proposed method is validated by comparing the results to a two-dimensional semi-analytical approach that is available in the literature. Then for a single layer wall, the effects of side interfaces’ roughness, layer’s thickness, and dielectric constant on reflection and transmission coefficients are analyzed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: AEU - International Journal of Electronics and Communications
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
