Abstract
Transition noise properties in longitudinal thin film media are studied by micromagnetic modeling. The mechanism for enhancement of transition noise at small bit intervals due to intertransition interaction is investigated. The noise dependence on the medium parameters, such as saturation magnetization and film thickness, is calculated. Reducing either the saturation magnetization or the film thickness yields a reduction of transition noise at low recording densities and a reduction of the noise enhancement at high recording densities. The effect of stress-induced longitudinal magnetic orientation is studied for an application of a uniaxial and spatial uniform compressive stress in the recording direction. The calculation shows that films with higher orientation ratio exhibit higher transition noise at small bit intervals. >
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