Abstract
A new methodology aimed at assessing the large-signal stability of nonlinear driven circuits in the large-signal regime is presented. The procedure combines the conversion matrix approach with a transient envelope simulation and can be implemented with most commercial nonlinear microwave CAD tools. A method for the analysis of the onset of spurious oscillation in nonlinear circuits operating in large-signal conditions is also given and criteria for the evaluation and modification of the critical loads that give rise to spurious frequencies are provided. This approach has been successfully tested on a medium-power amplifier.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
