Transient testing of logic networks

Abstract

A package of logic network analysis programs has been developed at the Kingston Polytechnic in the past two years. The initial stage of this work, concerning the testing of combinational networks in steady-state conditions, and an intermediate stage, concerning the analysis of sequential networks have been described previously. This paper outlines the methods used to test the performance of logical networks under transient conditions. The detection of possible transient errors is especially necessary in sequential networks which frequently staticise such errors, causing permanent mal-functioning. The program described provides means of detecting and classifying staticised errors in sequential networks and locating the source of transient errors in combinational and sequential networks.