Abstract
Abstract A time-dependent measurement system has been developed for positron annihilation spectroscopy to study the effects of light irradiation at liquid nitrogen temperature. The system enables the measurement of positron annihilation lifetimes after pulse light irradiation, utilizing various time windows to investigate the transient changes of photo-excited vacancy-type defects. Additionally, this system facilitates coincidence Doppler broadening measurements during light irradiation at liquid nitrogen temperature. The system was successfully employed to analyze changes in positron lifetime and positron annihilation sites in electron-irradiated single-crystalline ZnO under light irradiation.
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