Abstract
The dynamics of carriers excited from both bulk and superlattice samples of Cd1−xMnxTe have been analyzed using a picosecond transient grating optical technique in a reflection geometry. Two distinct relaxation times were observed from the decays of orientational and carrier density gratings, yielding an upper bound on the ambipolar mobility of 6000 cm2/(V s). Measurements have been performed as functions of sample temperature, photon energy, and grating period.
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