Transient Characteristics of Charging Effects due to E-Beam Irradiation: A Method of SEY-Based Charging Balance Mode

Abstract

Charging effects of dielectric due to space electron beam irradiation have a huge impact on spacecraft. To understand charging equilibrium characteristics of dielectric under electron beam irradiation, in this paper, we present a novel numerical simulation method for analyzing the secondary electron yield (SEY) based on a charging balance mode. We used the Mott scattering model and the Penn dielectric function (PDF) model to calculate the collisions between incident electrons and material the atoms of material. For internal charge transport, we considered the processes of drift, diffusion, trapping, and neutralization. These were calculated with a finite-difference time-domain (FDTD) method. Based on mechanisms of import–export dynamic charge evolution, charging balance can be categorized into three modes: SE mode, leakage (LE) mode, and cooperation (CO) mode (a combination of the two). In most situations, the SE mode corresponds to the surface charging state, while the LE mode always corresponds to deep charging states. Shortening the distance of free charge transport, a thinner sample is more likely to present as LE mode. Although the surface potential can be enhanced by monotonously increasing the thickness, the total internal charge quantity approaches a local maximum with thickness because of a charging balance mode transformation. In addition, with a larger average density of carriers in the LE mode, the material conductivity is enhanced and the dielectric loss tends to be larger at low frequencies (<103 Hz). The charging balance mode method in this study can also be appropriate to the analyses of altering irradiation parameters and materials intrinsic parameters.