Abstract
Density functional based tight binding simulations were used to explore the fundamental charging of graphene nanoflakes, either by an electron-beam or electric current, to determine the effective failure limit with respect to induced charge. During this study we find that the failure limit of graphene is sufficiently high as to pose no problem to the operation of graphene-based electronic devices, but that localized regions may be transformed from an sp 2 -bonded into an sp 3 -bonded material before the failure limit. These regions are consistent with the carbon framework observed in graphane, but occur in the absence of hydrogen.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
