Abstract
As low-cost transparent conducting oxides (TCO), ZnO based materials have been widely used in flat panels, sensors, glasses and transparent electronic systems. ZnO based thin films are preferable instead of other TCO materials such as Indium Tin Oxides (ITO) due to electrochemical stability, non-toxicity, low cost. The physical and chemical properties of ZnO based devices depend on the stoichiometry, amount of impurity (dopant), and deposition method. In this study Mg doped zinc oxide (MZO) thin films with doping ratio varying from 1% to 5% were deposited by sol-gel dip coating method to improve the physical characters by forming the grain size. Structural and optical properties were investigated by means of XRD analysis, ultraviolet–visible (UV–VIS) and photoluminescence (PL) spectroscopy. Moreover, DFTB + method was preferred to determine electronic properties based on structural information obtained from XRD analysis. Experimentally determined band-gaps were compared with theoretically calculated gap values in which oxygen vacancies are considered.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
