Tracing the nitrogen nutrient status of crop based on solar-induced chlorophyll fluorescence

Abstract

Accurate and non-destructive monitoring of wheat nitrogen nutrition is of great significance for field fertilizer management to ensure crop yield and quality, reduce environmental pollution, and improve economic benefits. Compared with spectral vegetation indices (which are sensitive to greenness and structural parameters), or active fluorescence (which is limited to small-scale studies), solar-induced chlorophyll fluorescence (SIF) provides a direct measure of crop response to environmental stress and photosynthetic characteristics. However, there has been few studies comparing agronomic parameters, photosynthetic parameters, vegetation indices and SIF as an indicator of nitrogen status. In this paper, we therefore explore these measures as tools for monitoring nitrogen nutrition. During the 2016–2017 growing season, we conducted a field experiment in Rugao, Jiangsu Province, China, using winter wheat (Triticum aestivum L.) and different nitrogen treatments. The sensitivity of SIF indices, vegetation indices, photosynthetic parameters and agronomic parameters to crop nitrogen status were compared. Our results demonstrated that, compared with vegetation indices and agronomic parameters, the ratio of SIF emission peaks (FY687/FY761) responded to nitrogen status most rapidly at both the leaf and canopy scales, as soon as the fourth day after treatment (DAT4). A wheat nitrogen nutrition index (NNI), based on FY687/FY761, was used to construct a leaf dry matter (LDM-based NNI) diagnostic model, which will be beneficial for monitoring and diagnosing the nitrogen nutrition status of wheat leaves. Our results also illuminate the physiological mechanism that enables SIF to be used as a tool to monitor nitrogen nutrient status, primarily through changes in the proportion of light energy distribution. These findings provide theoretical and technical support for monitoring and diagnosing wheat nitrogen nutrition status based on SIF technology.