Abstract
AbstractWe model the transient free electron density in laser‐irradiated dielectrics with a kinetic approach. The internal electrical field responsible for the strength and mechanisms of photon absorption is calculated self‐consistently in dependence on the increasing free electron density. The results show the threshold behavior of the absorbed energy, responsible for dielectric breakdown (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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