TRACE—traceability and reliability assuring computerized environment : Koji Ohtoriet al. Proceedings of the 21st Symposium on Reliability and Maintainability, Japan, 25 (June 1991)

Abstract

At short gate lengths, narrow multiple-gate FETs (MuGFETs) are known to offer superior short channel effect (SCE) control than their bulk Si counterpart [Doyle BS et al. High performance fully-depleted tri-gate CMOS transistors. IEEE Electron Dev Lett 2003;24(4):263–5, van Dal MJH et al. Highly manufacturable FinFETs with sub-10 nm fin width and high aspect ratio fabricated with immersion lithography. In: VLSI Symp Tech Dig; 2007. p. 110–1 [1], [2]]. In addition, their undoped channels allow a substantial reduction of the threshold voltage (VT) mismatch, which makes the MuGFET an excellent candidate for replacing planar MOSFETs in SRAM structures. However, as the Si fin width (Wfin) and gate length (Lg) are down-scaled in order to improve the SCE control and current drive, respectively, the gate work function and access resistance (RSD) engineering become more challenging.In this paper, two approaches for optimizing the performance of narrow MuGFETs are reported and analysed: the first one relies on the thickness of their Plasma-Enhanced-ALD (PE-ALD) TiN gate electrode. It is demonstrated that very thin PE-ALD TiN gate electrodes allow improved SCE control and enhanced performance in nMOS MuGFETs. The second approach relies on non-amorphizing ion (boron) implantations for both extension and HDD implantations. A substantial RSD reduction is demonstrated for pMOS MuGFETs with Si fin widths down to 10 nm.