Trace resistance and the decay of long-term memory

Abstract

A theory of storage in long-term memory is described which characterizes the trace by two properties: strength and resistance. The theory makes four assumptions: (a) The rate of decay of strength equals the force on the trace divided by the resistance. (b) Force is proportional to trace strength and to the similarity of current traces to the previously established trace. (c) Resistance increases as the square root of trace age. (d) The resistance of a trace transfers completely to subsequent increments. The theory accounts for long-term retention functions over delays from 1 min to 2 yr, long retrograde amnesia, unlearning, effects of multiple learning trials and spacing of practice, and possibly recency judgments and retention functions following relearning.