Abstract
With secondary ion mass spectrometry as a new analytical method, which grants trace element determination in the microscale at the ppma-level and below, the abundance, distribution, and correlation of Mn, Fe, Cu, Ga, Ge, As, Ag, Cd, In, Sb, Hg, Tl, and Pb in sphalerites from different occurrences of the Eastern Alps were studied. On the whole the trace element characteristics known from average analyses is confirmed also in the microscale, but in different crystallization stages of one and the same deposit considerable variations can be found. Also in the correlation of elements great differences exist. The eminent inhomogeneity in trace element distribution is an indication for the presence of microcrystals. Thus the assumed Tl-content of already mentioned Pb-As-S-microphases has been confirmed in these investigations.
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