Abstract
Abstract A galvanic stripping analysis procedure is described for the trace determination of indium(III). The determination involves the reoxidation of predeposited indium on the mercury-film-coated glassy carbon electrode in open circuit position (in the absence of external potential or current input or oxidant in solution). The reoxidation of indium was shown to occur due to the formation of localized galvanic cells. The time of reoxidation (stripping) was found to be proportional to the concentration of indium present in the solution (1 to 100 ppb). The details of the development of such a procedure and its possible application to determination of indium in zinc deposits and aluminium alloys are discussed.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
