Abstract
A radiofrequency (rf) glow discharge ion source coupled to a commercial double-focusing mass spectrometer was used for the direct trace element analysis of glass samples. By utilizing an additional ring-shaped magnet located behind the flat sample in an rf glow discharge ion source compared with a configuration without a magnet, the sputtering and ionization efficiency of glass samples was enhanced and the detection power for trace elements was improved. The detection limits for elements determined by rf glow discharge mass spectrometry at low mass resolution (m/Δm = 300) are 10–100 ng/g. Possible interferences of atomic ions of analyte and molecular ions which limited the determination of some elements (e.g. Ti, Mn, Fe, Ni, Co, Cu, Zn) could be resolved at the mass resolution of m/Δm = 3000. The detection limits for these elements were found to be about 100 ng/g. Relative sensitivity factors (RSFs) for all elements of interest with respect to Sr (internal standard element) were determined in the range of 0.2–3.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
