Abstract
Basic ionization and drift properties are simulated for neon by the method of multiparticle dynamics. This calculation revealed that, in neon—in just the same way as in other gases that were studied previously—the Townsend ionization regime is realized even in strong fields if the distance between electrodes is rather large. The dependences of basic ionization and drift properties on the reduced electric-field strength are obtained. The results agree with available experimental data. The escape curve separating the region of efficient electron multiplication from the region in which electrons leave the discharge gap without undergoing multiplication is found for neon. The efficiency of the formation of a runaway-electron beam in helium and neon is simulated.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
