Abstract

Ultra-small clusters containing few atoms are of high interest in both fundamental research and applications due to their specific functional, magnetic or chemical properties which depend on size and composition. The experimental results of the morphology of the size-selected clusters, consisting of few atoms can be an ideal benchmark for sophisticated theoretical models. With this motivation we have investigated the geometrical structure of mass-selected Au9 clusters deposited on a silicon substrate prepared by soft-landing conditions. We present results obtained experimentally by Grazing-Incidence Small-Angle X-ray Scattering (GISAXS). Considering the ultra-small size of the clusters and small quantities of material on the surface, we combined advanced techniques which allowed us to investigate the surface structure of the sample. The resulting structural sizes are in concordance with cluster theory. Using a model-based approach, the advanced X-ray techniques allow for understanding how to resolve the possible cluster structure, identify optimal experimental conditions and obtain the probable morphological information which is challenging to be obtained otherwise.

Highlights

  • The black arrow indicates the subtracted data frame, the red one-the maximum of the adatomic spot. (d) GISAXS out-of-plane line cuts at the position with the maximum amount of material obtained from the XRF data

  • We present an approach to obtain the geometrical shape for deposited ultrasmall metallic clusters using Au9 on Si/SiO2 as a case study. This was done using the GISAXS experimental technique which provided us with the average characteristics of the sample

  • For the first time we were able to obtain structural values using a scattering method on supported, small mass selected clusters indicating a preferential 3D shape of the Au9 clusters on the Si/SiO2 surface depicted in Fig. 4c with a radius RAu9 ≈ 0.43 nm

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Summary

Introduction

Fluorescence and scattering data for the sample with deposited 50% ML material of adatoms (a–e) and sputtered (f) clusters. (b) XRF spectra of the sample for adatomic spot (red), Au markers (black) and Si (blue).

Results
Conclusion

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