Abstract

Cuprorivaite, also known as Egyptian blue (EB), CaCuSi4O10, has been utilized as an important blue pigment for thousands of years. It shows a 430–800 nm broad excitation band and an intense 910–920 nm near-infrared (NIR) emission peak at room temperature. The application that motivates the current research is for luminescent solar concentrator (LSC) usage. Current technology for this purpose relies on high near-infrared reflectance. This article addresses the investigation of the relationship between dispersing methods and photoluminescence (PL) intensity. Mechanical grinding methods investigated in the study were: horizontal bead mill, exfoliation and three-roll mill. The initial aim of the study was to verify if the proposed methods do not damage PL. To the surprise of the authors, three-roll mill treatment enhanced PL by nearly 50% without altering the morphology of the powder. An X-ray diffraction study suggested slight alterations in the crystal lattice.

Highlights

  • IntroductionPublisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affiliations

  • In order to use Egyptian blue to make an effective luminescence solar concentrator, it is necessary to produce a fine powder that could be used as a material base for production of printing pastes, inks and paints

  • This can be achieved by material grinding and

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Summary

Introduction

Publisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affiliations. There is a limited number of known luminophores that exhibit near-infrared luminescent properties [1]. The available ones may have a limited lifespan and may lose the ability to luminescence due to the action of oxygen, weather conditions, temperature or even light [2]. One of the pigments that exhibits luminescent properties is calcium copper tetrasilicate, CaCuSi4 O10 , known as Egyptian blue. This compound occurs naturally in the form of the cuprorivaite mineral, which was confirmed by X-ray diffraction analysis [3]

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