Abstract
This work targets design of a reliable universal logic gate in Quantum-dot cellular automata (r-ULG with the single clock zone, r-ULG-II with multiple clock zone) with hybrid cell orientations that realizes majority and minority functions simultaneously with high fault tolerance. The characterization of the defective behaviour of r-ULGs under different cell deposition defects is investigated. The outcomes indicate that the proposed r-ULG provide 75% fault tolerance under single clock zone and 100% under two clock zone.
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