Abstract
The effective conductivity of a contact system is an important characteristic used to link the microstructure of the contact system to its performance. A resistor network model has been developed from the cross-sectional slices of a given electrical contact system. This allows the total resistance across the model and hence the total conductance of the system to be calculated. This resistor network model development is based on the contact interface, of the contact system, which is presented as a 3-D contact map. The 3-D contact map consists of contact spots that have been extended across the two bodies of the contact system as asperities. In this modeling process, a technique is developed that pictures any cross-sectional slice of the contact system and shows in which voxels the electric current flows. An X-ray computed tomography method is used to collect the data for visualizing the contact system and preparing the 3-D contact map. A 250-V, 16-A rated ac single-pole rocker switch is used as the contact system for investigation.
Highlights
The electrical contact is an important component in many fields of engineering and sciences as it is an integral part of all electrical and micro-electronic devices [1,2,3,4,5,6,7]
The 1-bit 2D cross-sectional slice images of the contact system are analyzed with Contact Analysis Techniques (CAT∗). These CAT∗ are developed and implemented with a suite of tools developed in MATLAB and Image Processing Toolbox in order to build the resistor network model of the contact system
The 3D contact map is visualized using the 2D crosssection slice images which are processed and implemented using CAT∗ with a suite of tools developed in MATLAB as described in [1]
Summary
The electrical contact is an important component in many fields of engineering and sciences as it is an integral part of all electrical and micro-electronic devices [1,2,3,4,5,6,7]. More interesting studies in recent times are focused on non-destructive visualization methods involving Magnetic Resonance Imaging (MRI) [13, 14] and X-ray Computed Tomography (CT) [1, 10, 11, 15, 16]. These visualization methods offer the possibility to acquire 2D and 3D views of the samples without dismantling the component parts and destroying any features
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