Abstract
The coupled dipole method (CDM) and the method of moments (MOM) can both be applied to study the light scattering responses of microstructures commnly found in optical and infrared thin films. A comparative analysis of the MOM and the CDM for these scattering problems is done. Three estimates of the polarizability scalars of subregional volumes are also compared.
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Schedule a callMore From: International Journal of Infrared and Millimeter Waves
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