Abstract
Chromatic confocal metrology suffers from a limitation in the number of measurement points that can be measured simultaneously in a single frame acquisition. We propose chromatic confocal areal metrology (ChromaCAM), in which the surface height for each point in a 2D grid of measurement spots, generated by a rectangular micro-lens array, is parallely analyzed through the utilization of a pinhole multiplexer unit, an analog optical analysis unit, and postprocessing algorithms. An experiment shows the viability of the simultaneous acquisition of multiple measurement points and the advantages over exisiting areal chromatic confocal approaches. Compared with conventional chromatic confocal metrology, the increase in the acquisition rate is significant and enables one-shot measurements.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
