Abstract
Oxygen octahedral rotations (OOR) in perovskites couple strongly to their electronic and magnetic properties, providing another instrument of control for creating functional materials with desired properties [1]. Epitaxial thin films constitute a natural playground for manipulating OOR since the local structure and microstructure of the film can be tuned through the elastic, electrical, and chemical interactions with the substrate. It is therefore critical to characterize OOR at the heterointerface, a planar crystal defect. X-ray and neutron diffraction techniques can fully determine the octahedral rotation angles and phases, but their spatial resolution is poor [2]. On the other hand, electron microscopy imaging techniques, including HRTEM [3], bright field (BF) [4] and annular bright field (ABF) [5]
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