Abstract
This paper proposes the standardization of total reflection X-ray fluorescence (TXRF) analysis for environmental and biological samples. The importance of TXRF in environmental and biological analysis is now well established and it is continuously growing. However in these fields there are not standardized methods reported by the International Standard Organization (ISO). For this reason, the international collaboration for the development of new standard procedures and methods for TXRF analysis is required. Indeed, a project for “Interlaboratory comparison of TXRF spectroscopy for environmental analysis” was set up in the frame of the Versailles Project on Advanced Materials and Standards, with the aim of developing a new ISO standard for TXRF devoted to environmental and biological analysis.
Highlights
The importance of total reflection X-ray fluorescence (TXRF) analytical technique for chemical nanoscale metrology of environmental and biological samples is well established and it is continuously growing [1].The applicability of TXRF in most of the environmental fields is still under exploration
This paper proposes the standardization of total reflection X-ray fluorescence (TXRF) analysis for environmental and biological samples
A project for "Interlaboratory comparison of TXRF spectroscopy for environmental analysis" was set up in the frame of the Versailles Project on Advanced Materials and Standards, with the aim of developing a new International Standard Organization (ISO) standard for TXRF devoted to environmental and biological analysis
Summary
The importance of total reflection X-ray fluorescence (TXRF) analytical technique for chemical nanoscale metrology of environmental and biological samples is well established and it is continuously growing [1]. The key advantages of TXRF are: simultaneous multielement trace analysis including halogenides; analysis of very small sample amounts in nanograms or micrograms range; simple quantification using an internal standard; suitable for various sample types and applications; theoretically no matrix or memory effects; low operating costs; quick, a short time is required to perform sample preparation and TXRF measurement, high sensitivity and low detection limits in the order of ppb, depending on the sample (elements) and the matrix
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