Abstract
Total reflection X-ray fluorescence analysis (TXRF) is an energy dispersive technique of special excitation geometry suitable for the determination of light elements, such as Al, Mg, Na and F, and even down to B. A special spectrometer adapted to the problems of the detection of low energy X-rays is required, details of which are discussed. An overview of such possible X-ray sources as standard X-ray tubes, special windowless X-ray tubes and synchrotron radiation is given and results are presented. Various methods of changing the spectral distribution for efficient excitation and for the reduction of background are discussed. Detection limits depend upon the source, and are in the range of some hundred femtograms using synchrotron radiation and in the range of some pg using a special windowless X-ray tube with a Si anode.
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