Abstract
This work is to demonstrate the usefulness of total reflection X-ray fluorescence (TXRF) for fast and reliable quantitative analysis of heavy metals in plants used for accumulation studies. A model study of beans germination in lead contaminated environment under controlled laboratory conditions was realized. Metal accumulation in different parts of the plant was evaluated. Two different sample preparation procedures for TXRF analysis were considered: microwave acid digestion and direct analysis of suspended powdered sample. Quantitative determination of macro, micro, and trace elements was performed. Root showed the highest accumulation of lead, followed by stem, leaves and crops. Results showed that direct analysis of suspended powdered samples may be used as a fast and simple method for screening.
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