Total reflection hard x-ray photoelectron spectroscopy: Applications to strongly correlated electron systems

Abstract

We demonstrate that total reflection hard x-ray photoelectron spectroscopy (TR-HAXPES) is a versatile method for elucidating a difference between surface and bulk electronic states of strongly correlated electron systems, complementing conventional bulk sensitive hard x-ray photoelectron spectroscopy (HAXPES). To demonstrate the experimental feasibility of the method, we investigated ${\mathrm{La}}_{0.6}{\mathrm{Sr}}_{0.4}{\mathrm{MnO}}_{3}$ and the electron-doped high-${T}_{\mathrm{C}}$ superconductor ${\mathrm{La}}_{1.9}{\mathrm{Ce}}_{0.1}{\mathrm{CuO}}_{4}$. From the incident angle dependence of the spectral line shapes, we found that the surface-sensitive TR-HAXPES measurement equivalent to soft x-ray photoelectron spectroscopy is possible in the total reflection condition. The results strongly suggest that this method allows us to measure both surface and bulk electronic states without making any changes to experimental setup such as the energy resolution, x-ray energy, and the beamline.