Total operational support test systems for weapon system electronics

Abstract

Test equipment and other products that support test have continuously evolved along with the rest of the electronics technology. That is, for the same or better performance, modern test equipment packaging is much smaller and lower cost. In addition, test equipment controls and data interface directly with a computer data bus and/or standard computer I/O. Modern test equipment, PC computers, windows operating systems, high level test languages, and test programs can be combined in a system design that. Provides weapon system electronics testing at all levels of operational support (from depot to forward operating base). Therefore, a test system design and test program sets can be made for a weapon system that replaces the present practice of multiple specialized designs. The same can be said for supporting several different weapon systems deployed to the same forward operating base. This common test system design concept provides significant cost savings and increased support flexibility. This paper addresses the following topics: (i) test systems role in weapon system operational support; (ii) types of electronics testing required; (iii) COTS hardware and software test systems; (iv) one test system design that can do it all; (v) concept of operation; (vi) real test system example.