Abstract
Total internal reflection of a pulsed light beam upon an interface between two dielectric media is investigated by means of a rigorous plane-wave expansion method, and a simple analytical expression of the reflected pulsed beam is obtained on the condition of Gaussian-shaped pulsed beam illumination. It is shown that, because of the frequency-dependent Goos–Hänchen shift, the reflected pulsed beam undergoes position-dependent distortions including carrier frequency shift, phase shift, pulse duration, and chirp, which are of theoretical importance for designing optical devices used for total internal reflection of ultrashort pulses.
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