Abstract
Total hemispherical emissivities were measured for Inconel 718 as a function of sample temperature. Measurements were made for both unoxidized and oxidized samples. The oxidation temperatures were 1000°C, 1100°C and 1142°C and the oxidation times were 15, 30 and 60 min, respectively. The oxidized samples showed a significant increase in emissivity over the unoxidized one which was in an as-received condition. No apparent pattern was observed in the change of emissivity as a function of oxidation time at a given oxidation temperature. In some cases, emissivity measurements made with increasing temperature were greater than those made with descending temperature. One possible explanation for this is the spalling of the oxide layer as the sample area contracted with descending sample temperature.
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