Abstract

The reflection of X-rays from solid surfaces is comprehensively studied using the measurements of patterns of total external reflection and X-ray diffraction with the aid of a parabolic mirror. Principles for theoretical processing of X-ray patterns are developed. An inverse dependence of the refractive index of X-ray radiation on the interplanar distances in crystallites is obtained.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call