TOT01, a time-over-threshold based readout chip in 180nm CMOS technology for silicon strip detectors

Abstract

This work is focused on the development of the TOT01 prototype front-end ASIC for the readout of long silicon strip detectors in the STS (Silicon Tracking System) of the CBM experiment at FAIR - GSI. The deposited charge measurement is based on the Time-over-Threshold method which allows integration of a low-power ADC into each channel. The TOT01 chip comprises 30 identical channels and 1 test channel which is supplied with additional test pads. The major blocks of each channel are the CSA (charge sensitive amplifier) with two switchable constant-current discharge circuits and additional test features. The architecture of the CSA core is based on the folded cascode. The input p-channel MOSFET device, biased at a drain current 500 μA, was optimized for 30 pF detector capacitance while keeping in mind the area constraints — W/L = 1800 μm / 0.180 μm. The main advantage of this solution is high gain (GBW = 1.2 GHz) and low power consumption at the same time. The amplifier is followed by the discriminator circuit. The discriminator allows for a global (multi-channel) differential threshold setting and independent compensation for the CSA output DC-level deviations in each channel by means of a 6-bit digital to analog converter (DAC). The output pulse of this processing chain is fed through a 31:1 multiplexer structure to the output of the chip for further processing. The TOT01 chip has been fabricated in the UMC 0.18 μm CMOS process (Europractice mini@sic). It has 78 pads, measures approximately 1.5x3.2 mm2 and dissipates 33 mW. The channels have 50 μm pitch and each consumes 1.05 mW of power. The chip has been successfully tested. Charge sensitivity parameters, noise performance and first X-ray acquisitions are presented.