Abstract
In‐plane alignments were found to occur in the product layers of corundum‐type Mg4Nb2O9 (MNO) and Mg4Ta2O9 (MTO) on rock‐salt‐type MgO(001) substrates as a result of a topotaxial interface reaction between a Nb2O5 (or Ta2O5) precursor and MgO at 800°C and higher. Such alignments were attributed to a topotaxial formation of (114)‐oriented MNO (or MTO) layers. This (114) orientation is hidden in the conventional XRD theta‐2theta scans due to an overlap of the film (114) peak with the substrate peak, MgO(002). Its presence was revealed by XRD pole‐figure measurements. The crystallographic relationship between MNO(114) [or MTO(114)] and MgO(001) is also discussed.
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