Abstract
In this paper, we consider the topological derivative concept for developing a fast imaging algorithm of thin inclusions with dielectric contrast with respect to an embedding homogeneous domain with a smooth boundary. The topological derivative is evaluated by applying asymptotic expansion formulas in the presence of small, perfectly conducting cracks. Through the careful derivation, we can design a one-iteration imaging algorithm by solving an adjoint problem. Numerical experiments verify that this algorithm is fast, effective, and stable.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Journal of electromagnetic engineering and science
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.