Abstract
Surface roughness caused by the grain growth of the RuCr non-magnetic intermediate layer (NMIL) was evaluated using the X-ray total reflection method. In the case of Ru NMIL, the value of root mean square roughness of NMIL ( σ) increases from 0.59 to 1.45 nm with increase in Ar gas pressure and/or thickness of the Ru layer. Judging from the loop slope and normalized coercivity, the degree of magnetic isolation increases as σ increases, independent of the Cr content of a RuCr NMIL. Furthermore, it was found that σ of NMIL is strongly correlated with wettability to the seed layer material and is enhanced by the lattice extension of NMIL.
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