Abstract
Microscopic topography of matte and mirror surfaces can be measured visually. A straight-line reticle perpendicular to the plane of incidence is optically projected obliquely onto the surface. The image deviates laterally in response to vertical surface deviation. A microscope equipped with a filar eyepiece is used to measure the image deviation from a straight line. A simple formula based on the geometry of the optics is used to calculate the topographic deviation. Precision on surface grooves of 0.0005–0.005 in. deep is about ±6%. Sensitivity is around 0.00003 in. The method is absolute, quick, easy, and usable on nonflat surfaces.
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