Abstract

We report the development of a tomographic image alignment method, based on the moment of charge density, for three-dimensional (3D) coherent diffraction microscopy. By using a 3D model system, we demonstrate that the moment of charge density improves the alignment accuracy over the conventional cross-correlation method. Better results are also obtained when we apply this method to the alignment of 27 experimental projections from a ${\text{GaN-Ga}}_{2}{\text{O}}_{3}$ quantum dot nanoparticle.

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