TOF SIMS and XPS study of the interaction of silanized E-glass with epoxy resin

Abstract

The interaction of a silanized E-glass plate surface with the diglycidyl ether of bisphenol S (DGEBS) has been studied using time-of-flight secondary ion mass spectrometry (TOF SIMS) and X-ray photoelectron spectroscopy (XPS). In the TOF SIMS spectra, in addition to a series of ion fragments readily assigned to the parent DGEBS epoxy resin, some new ion fragments attributable to the reaction product of DGEBS with the polymeric hydrolysed γ-aminopropyl triethoxysilane (HAPS) precoating have been observed. In the XPS spectra a mixed coating of HAPS and DGEBS was demonstrated by the presence of intense N1s and S2p peaks. With the previous demonstration that the HAPS deposit is strongly bound to the E-glass plate surface, direct confirmation of the formation of chemical bonds at the E-glasssilane-resin interfaces has been obtained. These conclusions were complicated by the presence of polydimethylsiloxane (PDMS) and the incorporation of aluminium and calcium ions from the HAPS silanized glass plate into the mixed coating of HAPS and DGEBS epoxy resin.